Description

Measured parameters can be
programmable
128 Bin classifications
Consults CIE norm, absolute value to read.
Reference Standard not needed for correct.
Can show the wavelength diagram
dynamically
Measurable optics characteristics: ג B p , ג
Bd , x, y, z, Purity, FWHM, CCT, IV and
luminous flux
Measurable electrical characteristics: VR,
IR, VF, IF, VFD (Thyristor judgment),
Delta VR and Delta IR
Measurable LED types: Lamp LED, Chip
LED
Kelvin contacts and polarity check

• Multiple language operation interface.
• Wide variety of reports for user's reference and analysis.
Production report: The throughput of specific period, each produced lot can be tracked as
customer, part-number, operating time, yield rate and the quantities of GO and No-Go
devices, etc.
Analysis reports: Raw data reading, the Max, Min, Mean and sigma values. Normal
distribution chart with ±3 sigma, High, Low limit value, Cp, CpU and CpL. All this
information and a chart can be pointed out on one A4 paper size sheet for easy reading and
filing.