PICK & PLACE HANDLER
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Device types:QFP, TSOP,SOP,PGA, BGA,PLCC, LGA 3mm X 3mm ~ 40mm X 40mm (Lead pitch : 0.4mm or more)
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Test Mode:Dual (Pitch between sockets : 80mm) Single
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Index Time:0.5sec. (Same for ambient and high temperature, direct contact) Index time varies depending on the kind of device and socket.
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Throughput:Max.4000 pcs/hr (Ambient, dual test mode) Throughput varies depending on the kind of device and socket.
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Binning:Max. 6 bins(in the case of JEDEC tray)
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Temperature:Ambient Temperature +50ºC ~ +90ºC (±2ºC) +90ºC ~ +130ºC (±3ºC)
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Tester Interface:GPIB, DIO
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Dimensions:170 x 140 x 175 cm (Excludes signal tower)
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Weight:Approx. 900kg
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Power Requirements:AC 200-240V 6KVA
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Compressed Air:0.49MPa or more (dry and clean air)
Description
Features :
Minimized Vibration
• Well matched mechanism and software helps to reduce the vibration of the machine
• Increases the lifespan of the socket and adaptor
Flexible Test Mode
• Soft contact design allows the IC to have minimal pressure with the socket during
placement, after which the force will be adjusted to the preset pressure.
• Inaccuracy of ±0.3mm in the test socket can compensated by the specially designed
mechanism.