Description

The Function of the Model DVF6000 is for the testing of power diode DVF parameters. Its
testing procedures first check the VF parameters to screen out abnormal VF diodes, and
then it measures the DVF parameter. The maximum current source it can provide is up to 25
A. The tester operates by first releasing a tiny current Im to prevent heating the P-N
junction temperature and then reads its VF value under a room temperature environment.
Next it flow a large IFT current, which is controlled by an adjustable PW setting, to
determine how much time the current will be permitted to flow through the diode junction
to heat up the junction temperature. Then it measures the VF again under the same Im
current after the IFT stops flowing. Measuring two VF differences under different
temperatures of P-N junctions is called DVF. This determines whether the soldering is
sufficient and whether the chip size is correct.